Microwave/Millimeter-Wave RCS Test System
- Microwave/Millimeter-wave Antena Test SystemOne/two/three-dimensional RCS imaging, capable of imaging diagnosis and analysis of target strong scatter;
- Fast imaging of target local scattering property, can achieve fast imaging at a near distance in the working environment;
- Technology utilizing near-field measurements to characterize far field RCS, which expands customers’ test scopes;
- Flexible system configuration enables free selection of local oscillator and emitter type, frequency extension is fast and convenient;
- Multi-domain measurement functionality offers three modes: frequency domain, time domain and angle domain;
- RCS measurement and calibration can eliminate impact on measurement results by errors and improve measurement precision;
- Time domain gate of hardware can compress background interference by pulse measurement technology and enhance measurement precision;
- Independent external IF input interface can realize external IF input and increase application flexibility.
- One/two/three-dimensional RCS imaging
